A realistic defect oriented testability methodology for analog circuits
Journal of Electronic Testing: Theory and Applications
DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
Analogue Fault Simulation Based on Layout-Dependent Fault Models
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Industrial Relevance of Analog IFA: A Fact or a Fiction
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Fault Modeling for the Testing of Mixed Integrated Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Test Pattern Generation for Realistic Bridge Faults in CMOS ICs
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Development of Fault Model and Test Algorithms for Embedded DRAMs
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Defect-oriented test methodology for complex mixed-signal circuits
EDTC '95 Proceedings of the 1995 European conference on Design and Test
SWITTEST: automatic switch-level fault simulation and test evaluation of switched-capacitor systems
DAC '97 Proceedings of the 34th annual Design Automation Conference
A digital partial built-in self-test structure for a high performance automatic gain control circuit
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Integrated Design and Test of Mixed-Signal Circuits
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Switch-level fault coverage analysis for switch-capacitor systems
Proceedings of the conference on Design, automation and test in Europe
An approach to realistic fault prediction and layout design for testability in analog circuits
Proceedings of the conference on Design, automation and test in Europe
Structural Fault Based Specification Reduction for Testing Analog Circuits
Journal of Electronic Testing: Theory and Applications
Defect-oriented testing of mixed-signal ICs: some industrial experience
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A new quality estimation methodology for mixed-signal and analogue ICs
EDTC '97 Proceedings of the 1997 European conference on Design and Test
17.2 A Design for Testability Study on a High Performance Automatic Gain Control Circuit
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Multi-VDD Testing for Analog Circuits
Journal of Electronic Testing: Theory and Applications
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In the recent past Inductive Fault Analysis (IFA) has been exploited for several aspects of analog testing. These include, test development, DfT schemes qualification, and fault grading. However, little attention is paid towards exploiting IFA in the design domain. In this paper we undertake a case study demonstrating how IFA can be exploited for improving specification based testing by design measures. The case study shows that the fault escape rate is lowered while specification based tests guarantee the parametric behavior.