Metrics, techniques and recent developments in mixed-signal testing
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Test Generation for Mixed-Signal Devices Using Signal Flow Graphs
Journal of Electronic Testing: Theory and Applications
A BIST scheme for on-chip ADC and DAC testing
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Implementation of a linear histogram BIST for ADCs
Proceedings of the conference on Design, automation and test in Europe
A sigma-delta modulation based BIST scheme for mixed-signal circuits
ASP-DAC '00 Proceedings of the 2000 Asia and South Pacific Design Automation Conference
A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs
Journal of Electronic Testing: Theory and Applications
Decreasing the Sensitivity of ADC Test Parameters by Means of Wobbling
Journal of Electronic Testing: Theory and Applications
Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST
Journal of Electronic Testing: Theory and Applications
Mixed-Signal Circuit Classification in a Pseudo-Random Testing Scheme
Journal of Electronic Testing: Theory and Applications
Increasing the performance of arbitrary waveform generators using sigma-delta coding techniques
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Reduction of errors due to source and meter in the nonlinearity test
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Exploit Analog IFA to Improve Specification Based Tests
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Reconfigurable data converter as a building block for mixed-signal test
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Built-in self-test methodology for A/D converters
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Towards an ADC BIST Scheme Using the Histogram Test Technique
ETW '00 Proceedings of the IEEE European Test Workshop
Efficient multisine testing of analog circuits
VLSID '95 Proceedings of the 8th International Conference on VLSI Design
A Path Sensitization Technique for Testing of Switched Capacitor Circuits
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
Determination of coherence errors in ADC spectral domain testing
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
17.3 Decreasing the Sensitivity of ADC Test Parameters by Means of Wobbling
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
ITC '00 Proceedings of the 2000 IEEE International Test Conference
TEST CHALLENGES FOR SONET/SDH PHYSICAL LAYER OC3 DEVICES AND BEYOND
ITC '01 Proceedings of the 2001 IEEE International Test Conference
RAMP TESTING OF ADC TRANSITION LEVELS USING FINITE RESOLUTION RAMPS
ITC '01 Proceedings of the 2001 IEEE International Test Conference
DYNAMIC TESTING OF ADCS USING WAVELET TRANSFORMS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
SIGNAL GENERATION USING PERIODIC SINGLE AND MULTI-BIT SIGMA-DELTA MODULATED STREAMS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST
ITC '97 Proceedings of the 1997 IEEE International Test Conference
On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST
Journal of Electronic Testing: Theory and Applications
Estimating the Integral Non-Linearity of Ad-Converters via the Frequency Domain
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Proceedings of the conference on Design, automation and test in Europe - Volume 1
A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
RF-BIST: Loopback Spectral Signature Analysis
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Journal of Electronic Testing: Theory and Applications
Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications
Journal of Electronic Testing: Theory and Applications
Efficient loop-back testing of on-chip ADCs and DACs
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
An implementation of memory-based on-chip analogue test signal generation
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
A First Step for an INL Spectral-Based BIST: The Memory Optimization
Journal of Electronic Testing: Theory and Applications
A BIST Scheme for SNDR Testing of ΣΔ ADCs Using Sine-Wave Fitting
Journal of Electronic Testing: Theory and Applications
Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation
Journal of Electronic Testing: Theory and Applications
Built-in sensor for signal integrity faults in digital interconnect signals
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A robust ADC code hit counting technique
Proceedings of the Conference on Design, Automation and Test in Europe
Digitizer error extraction in the nonlinearity test
ITC'94 Proceedings of the 1994 international conference on Test
An improved method of ADC jitter measurement
ITC'94 Proceedings of the 1994 international conference on Test
Design for testability of mixed signal integrated circuits
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics
Journal of Electronic Testing: Theory and Applications
An Output Response Analyzer Circuit for ADC Built-in Self-Test
Journal of Electronic Testing: Theory and Applications
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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