An implementation of memory-based on-chip analogue test signal generation

Authors:
Salvador Mir;Luis Rolíndez;Christian Domigues;Libor Rufer
Affiliations:
TIMA Laboratory, Grenoble;TIMA Laboratory, Grenoble;TIMA Laboratory, Grenoble;TIMA Laboratory, Grenoble
Venue:
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Year:
2003

Citing 3
Cited 0

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Abstract

This paper presents a memory-based on-chip analogue test signal generation approach that is suitable for the test of an Analogue and Mixed-Signal (AMS) core. This core contains programmable electronic interfaces for acoustic and ultrasound transducers. The test signals that must be generated on-chip have only low or moderate frequencies (10 Hz-10 MHz). The test circuitry designed in a 0.18 μm CMOS technology includes a programmable shift-register, a clock divider, and a programmable switched-capacitor filter bank. By controlling the shift-register length and the sampling frequency, the paper shows that high quality single tone signals can be generated on chip in the band of interest.