High Accuracy Stimulus Generation for A/D Converter BIST

Authors:
Aubin Roy;Stephen Sunter;Alessandra Fudoli;Davide Appello
Affiliations:
-;-;-;-
Venue:
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Year:
2002

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Abstract

A novel approach is presented for digital generation of an analog waveform suitable for BIST of high-resolution analog-to-digital converters (ADCs). The staircase-like exponential waveform is shown to have properties of a perfectly linear ramp when used as the stimulus for a 3rd order polynomial fitting algorithm that measures offset, gain, 2nd and 3rd harmonic distortion. The technique is particularly suitable for testing high resolution (12 bits) sigma-delta ADCs in a noisy environment, which can then be used to test digital-to-analog converters (DACs). Experimental results for a 44 kHz 16-bit ADC show that the technique measures distortion with better than 0.01% accuracy in the presence of random and 50 or 60 Hz noise.