DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST
Journal of Electronic Testing: Theory and Applications
An Analog Multi-Tone Signal Generator for Built-In Self-Test Applications
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST
Proceedings of the IEEE International Test Conference
A BIST Scheme for an SNR Test of a Sigma-Delta ADC
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Efficient and accurate testing of analog-to-digital converters using oscillation-test method
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Testing and Characterization of the One-Bit First-Order Delta-Sigma
ITC '00 Proceedings of the 2000 IEEE International Test Conference
High Accuracy Stimulus Generation for A/D Converter BIST
ITC '02 Proceedings of the 2002 IEEE International Test Conference
BIST and production testing of ADCs using imprecise stimulus
ACM Transactions on Design Automation of Electronic Systems (TODAES)
A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns
Proceedings of the conference on Design, automation and test in Europe - Volume 1
A Digital Test for First-Order [Sigma-Delta] Modulators
Proceedings of the conference on Design, automation and test in Europe - Volume 1
A Built-in-Self-Test Σ-Δ ADC Prototype
Journal of Electronic Testing: Theory and Applications
Pseudorandom BIST for test and characterization of linear and nonlinear MEMS
Microelectronics Journal
A decorrelating design-for-digital-testability scheme for Σ-Δ modulators
IEEE Transactions on Circuits and Systems Part I: Regular Papers
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Sigma---Delta (驴驴) modulators have made possible the design of high-resolution Analogue-to-Digital Converters (ADCs) with relaxed analogue circuitry precision by moving most of the design complexity to the digital domain. However, testing these 驴驴 ADCs is becoming a costly task due to trends towards high-resolution implementations and associated increase in samples required to extract key specifications. In this paper, we propose a Built-In Self-Test (BIST) technique for high-resolution 驴驴 ADCs. The technique, mostly digital, moves most of the test complexity to the digital domain, that is in-line with the philosophy of 驴驴 modulation. Both the test signal generation and the output response analysis are performed on-chip. The stimulus, a sinusoid encoded in a binary bit stream, is chosen to have very high quality in the bandwidth of the converter with the quantization error laying outside of the analogue modulator's bandwidth. For the output response analysis, a sine-wave fitting algorithm is implemented on chip. For this, a digital sinusoidal stimulus of a very high precision is needed as a reference signal. In this paper, we generate this reference signal from the same input stimulus, by passing it through the digital filter already existing in the converter. Simulations results show the capability of this technique to obtain measurements of the SNDR (Signal-to-Noise-plus-Distortion Ratio) for a 16-bit audio 驴驴 ADC.