Pseudo-random testing and signature analysis for mixed-signal circuits
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Metrics, techniques and recent developments in mixed-signal testing
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
A BIST scheme for on-chip ADC and DAC testing
DATE '00 Proceedings of the conference on Design, automation and test in Europe
The ΣΔ-BIST Method Applied to Analog Filters
Journal of Electronic Testing: Theory and Applications
New BIST Schemes for Structural Testing of Pipelined Analog to Digital Converters
Journal of Electronic Testing: Theory and Applications
BIST for D/A and A/D Converters
IEEE Design & Test
A high speed and area efficient on-chip analog waveform extractor
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Increasing the performance of arbitrary waveform generators using sigma-delta coding techniques
ITC '98 Proceedings of the 1998 IEEE International Test Conference
DfT and on-line test of high-performance data converters: a practical case
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Efficient and accurate testing of analog-to-digital converters using oscillation-test method
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
17.2 A Design for Testability Study on a High Performance Automatic Gain Control Circuit
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
HABIST: Histogram-based Analog Built In Self Test
ITC '97 Proceedings of the 1997 IEEE International Test Conference
ITC '97 Proceedings of the 1997 IEEE International Test Conference
DYNAMIC TESTING OF ADCS USING WAVELET TRANSFORMS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST
ITC '97 Proceedings of the 1997 IEEE International Test Conference
A Transition Based BIST Approach for Passive Analog Circuits
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
Subband Filtering Scheme for Analog and Mixed-Signal Circuit Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
An efficient linearity test for on-chip high speed ADC and DAC using loop-back
Proceedings of the 14th ACM Great Lakes symposium on VLSI
A codesign tool to validate and improve an FPGA based test strategy for high resolution audio ADC
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Efficient loop-back testing of on-chip ADCs and DACs
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Delta-sigma modulator based mixed-signal BIST architecture for SoC
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Test infrastructure design for mixed-signal SOCs with wrapped analog cores
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Fully digital strategy for fast calibration and test of ΣΔ ADC's
Microelectronics Journal
A BIST Scheme for SNDR Testing of ΣΔ ADCs Using Sine-Wave Fitting
Journal of Electronic Testing: Theory and Applications
Fully digital strategy for fast calibration and test of ΣΔ ADCs
Microelectronics Journal
Proceedings of the conference on Design, automation and test in Europe
Fast PWM-Based Test for High Resolution ΣΔ ADCs
Journal of Electronic Testing: Theory and Applications
PWM-based test stimuli generation for BIST of high resolution ΣΔ ADCs
Proceedings of the conference on Design, automation and test in Europe
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
A dynamic ADC test processor for built-in-self-test of ADCs
ICC'08 Proceedings of the 12th WSEAS international conference on Circuits
A robust ADC code hit counting technique
Proceedings of the Conference on Design, Automation and Test in Europe
An analog multi-tone signal generator for built-in-self- test applications
ITC'94 Proceedings of the 1994 international conference on Test
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics
Journal of Electronic Testing: Theory and Applications
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