Built-in self-test and fault diagnosis of fully differential analogue circuits
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
A new built-in self-test approach for digital-to-analog and analog-to-digital converters
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Industrial Relevance of Analog IFA: A Fact or a Fiction
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Analog and Mixed-Signal Benchmark Circuits-First Release
Proceedings of the IEEE International Test Conference
Test Generation and Concurrent Error Detection in Current-Mode A/D Converters
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
A BIST Scheme for an SNR Test of a Sigma-Delta ADC
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Reconfigurable data converter as a building block for mixed-signal test
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Built-in self-test methodology for A/D converters
EDTC '97 Proceedings of the 1997 European conference on Design and Test
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
A DFT Technique for Analog-to-Digital Converters with digital correction
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
17.2 A Design for Testability Study on a High Performance Automatic Gain Control Circuit
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Design for testability of mixed signal integrated circuits
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
A VHDL-based methodology for the design and verification of pipeline A/D converters
DATE '00 Proceedings of the conference on Design, automation and test in Europe
New BIST Schemes for Structural Testing of Pipelined Analog to Digital Converters
Journal of Electronic Testing: Theory and Applications
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This paper addresses the practical implementation of aDesign-for-Testability (DfT) technique applicable to digitally-corrected pipelined Analog-to-Digital Converters(ADC). The objective of this DfT is to improve both the on-andoff-line testability of these important mixed-signal ICs.Because of the self-correction capability, such a kind ofconverters has some inherent insensitivity to the effect offaults which represents a disadvantage for testing and diagnosis.We will show that potentially malfunctioning unitscan be concurrently identified with low extra circuitry. Inaddition, this structure-based DfT scheme can also be usefulto reduce the time in production-level testing. A CMOSswitched-capacitor 10-b ADC is used as demonstrator ofthe proposed technique.