Design for testability of mixed signal integrated circuits

Authors:
Kenneth D. Wagner;T. W. Williams
Affiliations:
IBM Corporation, Poughkeepsie, NY;IBM Corporation, Poughkeepsie, NY
Venue:
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Year:
1988

Citing 4
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Abstract

As chip densities increase it becomes cost effective to integrate both digital and analog circuitry in a common package. This work provides a starting point for a set of Design For Testability (DFT) principles that can be used with mixed signal integrated circuits.