On chip testing data converters using static parameters

Authors:
Karim Arabi;Bozena Kaminska;Mohamad Sawan
Affiliations:
Opmaxx Inc., Beaverton, OR and École Polytechnique, Montreal, P.Q., Canada;Opmaxx Inc., Beaverton, OR and École Polytechnique, Montreal, P.Q., Canada;Department of Electrical and Computer Engineering, École Polytechnique of Montreal, Montreal, Canada
Venue:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Year:
1998

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Abstract

In this paper, built-in self-test (BIST) approach has been applied to test digital-to-analog (D/A) and analog-todigital (A/D) converters. Offset, gain, integral nonlinearity (INL), and differential nonlinearity (DNL) errors and monotonicity are tested without using mixed-mode or logic test equipment. An offline calibrating technique has been used to insure the accuracy of BIST circuitry and to reduce area overhead by avoiding the use of high quality analog blocks. The proposed BIST structure presents a compromise between test cost, area overhead, and test time. By a minor modification the test structure would be able to localize the fail situation. The same approach may be used to construct a fast low cost off-chip D/A converter tester. The BIST circuitry has been designed and evaluated using complementary metal-oxide-semiconductor (CMOS) 1.2 µm technology.