BIST for D/A and A/D Converters
IEEE Design & Test
Static Testing of ADCs Using Wavelet Transforms
ATS '97 Proceedings of the 6th Asian Test Symposium
Built-in self-test methodology for A/D converters
EDTC '97 Proceedings of the 1997 European conference on Design and Test
On chip testing data converters using static parameters
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters
Journal of Electronic Testing: Theory and Applications
A design-for-digital-testability circuit structure for Σ-Δ modulators
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A Built-in-Self-Test Σ-Δ ADC Prototype
Journal of Electronic Testing: Theory and Applications
A decorrelating design-for-digital-testability scheme for Σ-Δ modulators
IEEE Transactions on Circuits and Systems Part I: Regular Papers
A robust ADC code hit counting technique
Proceedings of the Conference on Design, Automation and Test in Europe
Automatic linearity and frequency response tests with built-in pattern generator and analyzer
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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