DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
An Integration of Memory-Based Analog Signal Generation into Current DFT Architectures
Proceedings of the IEEE International Test Conference on Test and Design Validity
Proceedings of the IEEE International Test Conference
Signal Generation Using Periodic Single-and Multi-Bit Sigma-Delta Modulated Streams
Proceedings of the IEEE International Test Conference
A high speed and area efficient on-chip analog waveform extractor
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Increasing the performance of arbitrary waveform generators using sigma-delta coding techniques
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Implicit functional testing for analog circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
On chip testing data converters using static parameters
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Embedded software-based self-testing for SoC design
Proceedings of the 39th annual Design Automation Conference
Embedded Software-Based Self-Test for Programmable Core-Based Designs
IEEE Design & Test
Testing and Characterization of the One-Bit First-Order Delta-Sigma
ITC '00 Proceedings of the 2000 IEEE International Test Conference
An On-Chip Spectrum Analyzer for Analog Built-In Testing
Journal of Electronic Testing: Theory and Applications
Delta-sigma modulator based mixed-signal BIST architecture for SoC
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
A design-for-digital-testability circuit structure for Σ-Δ modulators
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Diagnosing integrator leakage of single-bit first-order ΔΣ modulator using DC input
Proceedings of the 2009 Asia and South Pacific Design Automation Conference
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
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