A digital partial built-in self-test structure for a high performance automatic gain control circuit
DATE '99 Proceedings of the conference on Design, automation and test in Europe
A sigma-delta modulation based BIST scheme for mixed-signal circuits
ASP-DAC '00 Proceedings of the 2000 Asia and South Pacific Design Automation Conference
A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs
Journal of Electronic Testing: Theory and Applications
A parametric test method for analog components in integrated mixed-signal circuits
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
The ΣΔ-BIST Method Applied to Analog Filters
Journal of Electronic Testing: Theory and Applications
Test and Testability of a Monolithic MEMS for Magnetic Field Sensing
Journal of Electronic Testing: Theory and Applications
Digital oscillation-test method for delay and stuck-at fault testing of digital circuits
ITC '98 Proceedings of the 1998 IEEE International Test Conference
17.2 A Design for Testability Study on a High Performance Automatic Gain Control Circuit
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Test Evaluation and Data on Defect-Oriented BIST Architecture for High-Speed PLL
ITC '01 Proceedings of the 2001 IEEE International Test Conference
On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST
Journal of Electronic Testing: Theory and Applications
Subband Filtering Scheme for Analog and Mixed-Signal Circuit Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Prediction of Analog Performance Parameters Using Oscillation Based Test
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Mixed Signal DFT: A Concise Overview
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
A Built-in-Self-Test Scheme for Segmented and Binary Weighted DACs
Journal of Electronic Testing: Theory and Applications
An On-Chip Spectrum Analyzer for Analog Built-In Testing
Journal of Electronic Testing: Theory and Applications
Multi-VDD Testing for Analog Circuits
Journal of Electronic Testing: Theory and Applications
Oscillation ring based interconnect test scheme for SOC
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
An ADC-BiST scheme using sequential code analysis
Proceedings of the conference on Design, automation and test in Europe
Total ionizing dose effects in switched-capacitor filters using oscillation-based test
Proceedings of the 20th annual conference on Integrated circuits and systems design
Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing
Journal of Electronic Testing: Theory and Applications
Oscillation Test Scheme of SC Biquad Filters Based on Internal Reconfiguration
Journal of Electronic Testing: Theory and Applications
Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits
IEICE - Transactions on Information and Systems
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Block-level Bayesian diagnosis of analogue electronic circuits
Proceedings of the Conference on Design, Automation and Test in Europe
A novel self-healing methodology for RF amplifier circuits based on oscillation principles
Proceedings of the Conference on Design, Automation and Test in Europe
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