Total ionizing dose effects in switched-capacitor filters using oscillation-based test

Authors:
John M. Espinosa-Duran;Jaime Velasco-Medina;Gloria Huertas;Jose Luis Huertas
Affiliations:
Universidad del Valle, Cali, Colombia;Universidad del Valle, Cali, Colombia;Institute of Microelectronic of Seville, Sevilla, Spain;Institute of Microelectronic of Seville, Sevilla, Spain
Venue:
Proceedings of the 20th annual conference on Integrated circuits and systems design
Year:
2007

Citing 3
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Abstract

This paper studies long-term effects produced by ionizing radiation in a switched-capacitor filter, using the Oscillation Based Test (OBT) approach [1]. In this case, threshold voltage shifting is considered as one of the major concerning effects produced by Total Ionizing Dose (TID). Simulation results show that the OBT approach is very well suited for detection of faulty filters.