Proceedings of the IEEE International Test Conference
A Signature Test Framework for Rapid Production Testing of RF Circuits
Proceedings of the conference on Design, automation and test in Europe
DSP-driven self-tuning of RF circuits for process-induced performance variability
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation Principles
Journal of Electronic Testing: Theory and Applications
Iterative built-in testing and tuning of mixed-signal/RF systems
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable Resistor
Journal of Electronic Testing: Theory and Applications
A test and calibration strategy for adjustable RF circuits
Analog Integrated Circuits and Signal Processing
A new self-healing methodology for RF amplifier circuits based on oscillation principles
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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This paper proposes a novel self-healing methodology for embedded RF Amplifiers (LNAs) in RF sub-systems. The proposed methodology is based on oscillation principles in which the Device-under-Test (DUT) itself generates the output test signature with the help of additional circuitry. The self-generated test signature from the DUT is analyzed by using on-chip resources for testing the LNA and controlling its calibration knobs to compensate for multi-parameter variations in the LNA manufacturing process. Thus, the proposed methodology enables self-test and self-calibration of RF circuits without the need for external test stimulus. The proposed methodology is demonstrated through simulations as well as measurements performed on a RF LNA.