Iterative built-in testing and tuning of mixed-signal/RF systems

Authors:
A. Chatterjee;D. Han;V. Natarajan;S. Devarakond;S. Sen;H. Choi;R. Senguttuvan;S. Bhattacharya;A. Goyal;D. Lee;M. Swaminathan
Affiliations:
School of Electrical Engineering, Georgia Institute of Technology, Atlanta, GA;Texas Instruments, Dallas, TX;School of Electrical Engineering, Georgia Institute of Technology, Atlanta, GA;School of Electrical Engineering, Georgia Institute of Technology, Atlanta, GA;School of Electrical Engineering, Georgia Institute of Technology, Atlanta, GA;School of Electrical Engineering, Georgia Institute of Technology, Atlanta, GA;Texas Instruments, Dallas, TX;Texas Instruments, Dallas, TX;School of Electrical Engineering, Georgia Institute of Technology, Atlanta, GA;School of Electrical Engineering, Georgia Institute of Technology, Atlanta, GA;School of Electrical Engineering, Georgia Institute of Technology, Atlanta, GA
Venue:
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
Year:
2009

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Abstract

Design and test of high-speed mixed-signal/RF circuits and systems is undergoing a transformation due to the effects of process variations stemming from the use of scaled CMOS technologies that result in significant yield loss. To this effect, post-manufacture tuning for yield recovery is now a necessity for many high-speed electronic circuits and systems and is typically driven by iterative test-and-tune procedures. Such procedures create new challenges for manufacturing test and built-in self-test of advanced mixed-signal/RF systems. In this paper, key test challenges are discussed and promising solutions are presented in the hope that it will be possible to design, manufacture and test "truly self-healing" systems in the near future.