Iterative built-in testing and tuning of mixed-signal/RF systems
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
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In this paper, a fast RF BIST-driven post-manufacture tuning methodology for yield improvement of RF transceiver systems is presented.The core algorithms optimize multiple transceiver performance metrics concurrently using a hardware-iterated gradient search algorithm that uses diagnostic BIST data to guide the tuning of circuit and software level parameters. Intelligent “initial guess” values for the circuit and software tuning knobs at the start of the tuning process allow rapid convergence. Power consumption is given key consideration through the tuning process.Further, self-tuning is performed with little or no external tester support. The viability of the proposed scheme has been demonstrated through an experimental RF hardware prototype. Experimental results demonstrate significant yield recovery while allowing up to 10X savings in test/tuning time.