Proceedings of the conference on Design, automation and test in Europe - Volume 1
Prediction of Analog Performance Parameters Using Oscillation Based Test
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Feature Extraction Based Built-In Alternate Test of RF Components Using a Noise Reference
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Generating decision regions in analog measurement spaces
GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
Lookup table based simulation and statistical modeling of Sigma-Delta ADCs
Proceedings of the 43rd annual Design Automation Conference
A DFT Approach for Testing Embedded Systems Using DC Sensors
IEEE Design & Test
Pro-VIZOR: process tunable virtually zero margin low power adaptive RF for wireless systems
Proceedings of the 45th annual Design Automation Conference
Verifying functional specifications by regression techniques on Lissajous test signatures
IEEE Transactions on Circuits and Systems Part I: Regular Papers
On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction
Journal of Electronic Testing: Theory and Applications
Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case Study
Journal of Electronic Testing: Theory and Applications
Iterative built-in testing and tuning of mixed-signal/RF systems
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
DSP-driven self-tuning of RF circuits for process-induced performance variability
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A built-in-test circuit for RF differential low noise amplifiers
IEEE Transactions on Circuits and Systems Part I: Regular Papers
Efficient EVM testing of wireless OFDM transceivers using null carriers
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures
Journal of Electronic Testing: Theory and Applications
Pulse shaping method using bridge tap for fast transient burst test generator
CSECS'11/MECHANICS'11 Proceedings of the 10th WSEAS international conference on Circuits, Systems, Electronics, Control & Signal Processing, and Proceedings of the 7th WSEAS international conference on Applied and Theoretical Mechanics
Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing
Journal of Electronic Testing: Theory and Applications
BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting
Journal of Electronic Testing: Theory and Applications
A test and calibration strategy for adjustable RF circuits
Analog Integrated Circuits and Signal Processing
Spatial correlation modeling for probe test cost reduction in RF devices
Proceedings of the International Conference on Computer-Aided Design
A new self-healing methodology for RF amplifier circuits based on oscillation principles
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Testing RF circuits with true non-intrusive built-in sensors
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
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In this paper, a fast transient testing methodology for predicting the performance parameters of analog circuits is presented. A transient test signal is applied to the circuit under (cut) test and the transient response of the circuit is sampled and analyzed to predict the circuit's performance parameters. An algorithm for generating the optimum transient test signal is presented. The methodology is demonstrated in a production environment using a low-power opamp. Result from production test data showed: 1) a ten times speedup in production testing; 2) accurate prediction of the performance parameters; and 3) a simpler test configuration