Verifying functional specifications by regression techniques on Lissajous test signatures

  • Authors:
  • Luz Balado;Emili Lupon;Joan Figueras;Miquel Roca;Eugeni Isern;Rodrigo Picos

  • Affiliations:
  • Department of Electronics Engineering, Universitat Politècnica de Catalunya, Barcelona, Spain;Department of Electronics Engineering, Universitat Politècnica de Catalunya, Barcelona, Spain;Department of Electronics Engineering, Universitat Politècnica de Catalunya, Barcelona, Spain;Department of Physics, Universitat de les Illes Balears, Palma, Spain;Department of Physics, Universitat de les Illes Balears, Palma, Spain;Department of Physics, Universitat de les Illes Balears, Palma, Spain

  • Venue:
  • IEEE Transactions on Circuits and Systems Part I: Regular Papers
  • Year:
  • 2009

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Abstract

In this paper, a low-cost method to verify functional specifications of analog VLSI circuits is proposed. The method is based on the analysis of Lissajous signatures combined with regression techniques. In order to obtain Lissajous signatures, the observation space is partitioned into zones using hyperplanes, and a set of integer values used as the digital signature of the circuit is generated by Lissajous curve zone crossings. A predictor function obtained by nonlinear regression techniques predicts the functional specification parameters of the circuit under consideration. The viability of this methodology is analyzed and applied to verify the center frequency f0 of a bandpass biquad filter. Experimental measurements show an accurate prediction of the center frequency of the designed filter.