Predictive test strategy for CMOS RF mixers

Authors:
E. Garcia-Moreno;K. Suenaga;R. Picos;S. Bota;M. Roca;E. Isern
Affiliations:
Electronic Technology Group, Physics Department, University of Balearic Islands, Palma de Mallorca 07122, Spain;Electronic Technology Group, Physics Department, University of Balearic Islands, Palma de Mallorca 07122, Spain;Electronic Technology Group, Physics Department, University of Balearic Islands, Palma de Mallorca 07122, Spain;Electronic Technology Group, Physics Department, University of Balearic Islands, Palma de Mallorca 07122, Spain;Electronic Technology Group, Physics Department, University of Balearic Islands, Palma de Mallorca 07122, Spain;Electronic Technology Group, Physics Department, University of Balearic Islands, Palma de Mallorca 07122, Spain
Venue:
Integration, the VLSI Journal
Year:
2009

Citing 5
Cited 2

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Abstract

In this paper, we present two built-in self-test strategies for the down-converter stage in a GSM receiver. These strategies are based on the prediction of its performance parameters from measurements in test mode. By reusing some receiver blocks as part of the test set-up, the circuitry overhead is kept small. The first strategy uses the local oscillator (LO) signal as the only test stimuli. The second strategy uses additional test circuitry, a generator, and an auxiliary mixer. Prediction accuracies are similar in both strategies, but the test observables in the second one are easier to be obtained.