Microwave mixers
RF microelectronics
Architecting Millisecond Test Solutions for Wireless Phone RFIC's
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Design for Variability in DSM Technologies
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
Built-In Test of RF Mixers Using RF Amplitude Detectors
ISQED '07 Proceedings of the 8th International Symposium on Quality Electronic Design
Parallel Loopback Test of Mixed-Signal Circuits
VTS '08 Proceedings of the 26th IEEE VLSI Test Symposium
Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction
ETS '08 Proceedings of the 2008 13th European Test Symposium
Predictive test strategy for CMOS RF mixers
Integration, the VLSI Journal
Defect Filter for Alternate RF Test
ETS '09 Proceedings of the 2009 European Test Symposium
Self-Calibrating Embedded RF Down-Conversion Mixers
ATS '09 Proceedings of the 2009 Asian Test Symposium
DSP-driven self-tuning of RF circuits for process-induced performance variability
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A novel self-healing methodology for RF amplifier circuits based on oscillation principles
Proceedings of the Conference on Design, Automation and Test in Europe
Improving Analog and RF Device Yield through Performance Calibration
IEEE Design & Test
Prediction of analog performance parameters using fast transient testing
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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A test and calibration strategy suitable for adjustable RF circuits is presented in this paper. Certain performance-affecting circuit elements are designed to be digitally controllable, providing the capability to adjust the performance characteristics of a circuit's instance around their post-fabrication values, throughout a set of discrete states of operation. The alternate test methodology is adopted for test and calibration and a set of optimally selected test observables is used to develop regression models for the prediction of the circuit's performance characteristics in every state of operation. In the test phase, measurements of the test observables are obtained from a subset of the circuit's states. The processing of these observables provides accurate prediction of the RF circuit's performance characteristics in all available states and enables the discrimination of defect-free from defective circuits. The latter is further accomplished by the exploitation of an extended superset of the test observables, the use of which intends to maximize fault coverage. Moreover, the predicted performance characteristics are also used to examine compliance with the specifications and to allow calibration of the RF circuit by identifying the appropriate state of operation at which all specifications are met and, consequently, by forcing the circuit to operate in this specific state. The efficiency of the proposed technique has been validated by its application to a typical differential RF Mixer designed in a 0.18 μm CMOS technology. Simulation results have been obtained and assessed.