Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case Study
Journal of Electronic Testing: Theory and Applications
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits
Journal of Electronic Testing: Theory and Applications
DSP-driven self-tuning of RF circuits for process-induced performance variability
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model
Journal of Electronic Testing: Theory and Applications
A test and calibration strategy for adjustable RF circuits
Analog Integrated Circuits and Signal Processing
Post-silicon debugging of PMU integration errors using behavioral models
Integration, the VLSI Journal
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Parallel testing of mixed-signal circuits has been considered a difficult task due to the limited resources in generating and analyzing multiple analog signals. A number of methods have been proposed to perform parallel testing of mixed-signal circuits using built-in test circuitry; however, these techniques are vulnerable to fault masking issues which may degrade the test accuracy. This paper presents an efficient parallel test algorithm for mixed-signal circuits based on a loopback test method. Multiple DUTs (Devices Under Test) are loopbacked externally on a loadboard which is loaded with a simple analog adder and an RMS detector. The performance parameters of each DUT are calculated separately from the composite responses, while removing the effect of fault masking. Parallelism is increased by sharing common test equipment and a DUT loadboard among the multiple DUTs. The mathematical theory and simulation results are presented to validate our algorithm.