Communication systems engineering
Communication systems engineering
RF microelectronics
Distortion Analysis of Analog Integrated Circuits
Distortion Analysis of Analog Integrated Circuits
Multi-output one-digitizer measurement
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Test Economics for Multi-site Test with Modern Cost Reduction Techniques
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Prediction of Analog Performance Parameters Using Oscillation Based Test
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Feature Extraction Based Built-In Alternate Test of RF Components Using a Noise Reference
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
Digital Signal Processing (4th Edition)
Digital Signal Processing (4th Edition)
Pseudorandom Test for Nonlinear Circuits Based on a Simplified Volterra Series Model
ISQED '07 Proceedings of the 8th International Symposium on Quality Electronic Design
Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
Parallel Loopback Test of Mixed-Signal Circuits
VTS '08 Proceedings of the 26th IEEE VLSI Test Symposium
Low Cost RF Receiver Parameter Measurement with On-Chip Amplitude Detectors
VTS '08 Proceedings of the 26th IEEE VLSI Test Symposium
LFSR-Based Performance Characterization of Nonlinear Analog and Mixed-Signal Circuits
ATS '09 Proceedings of the 2009 Asian Test Symposium
Challenges for Semiconductor Test Engineering: A Review Paper
Journal of Electronic Testing: Theory and Applications
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This paper presents new test methods for nonlinear Analog and Mixed-Signal (AMS) circuits which use a pseudorandom signal to test multiple Devices Under Test (DUTs) accurately. The goal of the studies presented in this paper is to understand the behaviors of nonlinear AMS circuits in a low-cost test environment and to develop the algorithm to extract the performance information of the DUTs using simple test measurements. The extracted information is then used to estimate the various specifications of DUTs. In order to achieve this goal, we analyze the behaviors of AMS circuits using a Volterra series model, and investigate the stochastic properties of the pseudorandom signals to develop the efficient performance characterization algorithms. The mathematical theory and experimental results are presented to validate the presented test methods.