A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs

Authors:
Vincent Kerzerho;Philippe Cauvet;Serge Bernard;Florence Azais;Mariane Comte;Michel Renovell
Affiliations:
Philips Semiconductors and LIRMM;Philips Semiconductors;LIRMM;LIRMM;LIRMM;LIRMM
Venue:
IEEE Design & Test
Year:
2006

Citing 7
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Abstract

Editor's note: Testing mixed-signal circuits remains one of the most difficult challenges within the semiconductor industry. In this article, the authors present a novel DFT technique to test sets of ADCs and DACs embedded in a complex SiP. The technique provides fully digital testing on the converters to significantly reduce the cost of testing.