A new built-in self-test approach for digital-to-analog and analog-to-digital converters
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Implementation of a linear histogram BIST for ADCs
Proceedings of the conference on Design, automation and test in Europe
DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
A Signature Analyzer for Analog and Mixed-signal Circuits
ICCS '94 Proceedings of the1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors
A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST
Proceedings of the IEEE International Test Conference
A BIST Scheme for an SNR Test of a Sigma-Delta ADC
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Towards an ADC BIST Scheme Using the Histogram Test Technique
ETW '00 Proceedings of the IEEE European Test Workshop
ETS '06 Proceedings of the Eleventh IEEE European Test Symposium
A spectral approach to estimate the INL of A/D converter
Computer Standards & Interfaces
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This paper presents an extension of the ANC ("Analogue Network of Converters")-based method, which is an original Design-for-Test (DfT) technique associated to a dedicated test algorithm to characterize the harmonic components of a set of embedded converters using only digital test resources. The ANC-based method was primarily developed under the assumption that the harmonics' phase is proportional to the input phase. This assumption is not valid for all converter architectures, where filtering effects may affect the harmonics' phase. The improved ANC-based method is able to calculate the magnitude of the harmonic components with unknown phase. The fundamental principle of this improved version of the ANC-based method is the same, but further mathematical developments have been established using a model independent from the harmonics' phase. The simulation results and the experiments show an excellent agreement between the values measured using the method and the values measured with a usual test setup, for the THD and SFDR parameters. Simulations were carried out considering both random phases and realistic phase delays such as the ones induced by a low pass filter.