A new built-in self-test approach for digital-to-analog and analog-to-digital converters

Authors:
Karim Arabi;Bozena Kaminska;Janusz Rzeszut
Affiliations:
Department of Electrical and Computer engineering, École Polytechnique de Montréal, P.O.Box 6079, Station Centre-Ville, Montréal, Québec, Canada H3C 3A7;Department of Electrical and Computer engineering, École Polytechnique de Montréal, P.O.Box 6079, Station Centre-Ville, Montréal, Québec, Canada H3C 3A7;Department of Electrical and Computer engineering, École Polytechnique de Montréal, P.O.Box 6079, Station Centre-Ville, Montréal, Québec, Canada H3C 3A7
Venue:
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Year:
1994

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Abstract

This paper proposes a test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-to-digital (A/D) converters. Offset, gain, linearity and differential linearity errors are tested without using test equipment. The proposed BIST structure decreases the test cost and test time. The BIST circuitry has been designed to D/A and A/D converters using CMOS 1.2 &mgr;m technology. By only a minor modification the test structure would be able to localize the fail situation. The small value of area overhead (AOH), the simplicity and efficiency of the proposed BIST architecture seem to be promising for manufacturing.