Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing

Authors:
Mustapha Slamani;Bozena Kaminska
Affiliations:
-;-
Venue:
IEEE Design & Test
Year:
1992

Citing 1
Cited 31

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Abstract

An approach based on functional testing and on sensitivity calculation of many output parameters for diagnosis of defective elements in analog circuits is presented. A sensitivity matrix that gives the relation between the deviation of output parameters and the deviation of defective components in a circuit forms the basis of the test equations. Diverse types of measurement help improve the diagnostic resolution. Experimental results are presented to clarify the algorithm and prove its efficiency in a practical case.