An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis

Authors:
Yongcai Ao;Yibing Shi;Wei Zhang;Yanjun Li
Affiliations:
School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China 611731;School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China 611731;School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China 611731;School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, China 611731
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2013

Citing 5
Cited 0

Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing

IEEE Design & Test
Analog and Mixed-Signal Benchmark Circuits-First Release

Proceedings of the IEEE International Test Conference
Engineering Circuit Analysis

Engineering Circuit Analysis
Fault diagnosis of analog circuits based on machine learning

Proceedings of the Conference on Design, Automation and Test in Europe
Challenges for Semiconductor Test Engineering: A Review Paper

Journal of Electronic Testing: Theory and Applications

Quantified Score

Hi-index	0.00

Visualization

Abstract

The challenging tolerance problem in fault diagnosis of analog circuit remains unsolved. To diagnose the soft-fault with tolerance effectively, a novel diagnosis approach based on the ratio of normal variables and the slope fault model was proposed. Firstly, the approximate distribution function of the ratio of normal variables was deduced and the basic approximate conditions were given to improve the approximation accuracy. The conditional monotonous and continuous mapping between the ratio of normal variables and the standard normal variable was proved. Based on the aforementioned proved mapping, the estimation formulas of the range of the ratio of normal variables were deduced. Then, the principle of the slope fault model for linear analog circuit was presented. After the contrastive analysis of the typical methods of handling tolerance based on the slope fault model, the ratio of normal variables and the slope fault model were combined and a test-nodes selection algorithm based on the basic approximate conditions of ratio of normal variables was designed, by which the computation can be reduced greatly. Finally, experiments were done to illustrate the proposed approach and demonstrate its effectiveness.