Automated translation of legacy code for ATE
Proceedings of the IEEE International Test Conference 2001
Recent Advances in Test Planning for Modular Testing of Core-Based SOCs
ATS '02 Proceedings of the 11th Asian Test Symposium
Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Design for Testability and Testing of IEEE 1149.1 Tap Controller
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
Logic BIST for Large Industrial Designs: Real Issues and Case Studies
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Challenges and directions for testing IC
Integration, the VLSI Journal
100 DPPM in Nanometer Technology... Is it achievable?
ITC '04 Proceedings of the International Test Conference on International Test Conference
IEEE Annals of the History of Computing
IEEE Annals of the History of Computing
A maintenance oriented Framework for software components characterization
CSMR '07 Proceedings of the 11th European Conference on Software Maintenance and Reengineering
Effects of Advances in Analog, Mixed Signal and IO Circuits on Test Strategies
ATS '08 Proceedings of the 2008 17th Asian Test Symposium
Evolutionary software engineering, a review
Applied Soft Computing
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model
Journal of Electronic Testing: Theory and Applications
Analog Circuits Fault Detection Using Cross-Entropy Approach
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
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Today's economical cycles challenge the test program generation process for semiconductors with regard to productivity, time-to-market, increasing quality requirements and manufacturing robustness, while, at the same time, the complexity of the system-on-a-chip mixed-signal integrated circuits to be tested increases significantly. Furthermore, commercial challenges in combination with competitive advantage become an important factor, not only within semiconductor manufacturing, but also within test program development. This paper provides a review of these challenges, and how they might be addressed. We first give a short introduction and background on semiconductor testing and test development with the focus on mixed-signal and systems-on-chip. This is followed by current roadmaps and considerations for test program software development. Based on the highlighted strength and weaknesses of the reviewed approaches, the authors conclude with some recommendations to address these challenges by adopting software engineering methods for the test program development process.