Analog and Mixed-Signal Benchmark Circuits-First Release

Testability analysis and multi-frequency ATPG for analog circuits and systems

Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design

Parametric fault diagnosis for analog systems using functional mapping

DATE '99 Proceedings of the conference on Design, automation and test in Europe

On Maximizing the Coverage of Catastrophic and Parametric Faults

Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999

Test generation based diagnosis of device parameters for analog circuits

Proceedings of the conference on Design, automation and test in Europe

Generation of optimum test stimuli for nonlinear analog circuits using nonlinear - programming and time-domain sensitivities

Proceedings of the conference on Design, automation and test in Europe

Fault Models and Test Generation for OpAmp Circuits—The FFM

Journal of Electronic Testing: Theory and Applications

Oscillation-Test Technique for CMOS Operational Amplifiers by Monitoring Supply Current

Analog Integrated Circuits and Signal Processing

Digital Signature Proposal for Mixed-Signal Circuits

Journal of Electronic Testing: Theory and Applications

Frequency Response Verification of Analog Circuits Using Global Optimization Techniques

Journal of Electronic Testing: Theory and Applications

Fault Diagnosis for Linear Analog Circuits

Journal of Electronic Testing: Theory and Applications

Structural Fault Based Specification Reduction for Testing Analog Circuits

Journal of Electronic Testing: Theory and Applications

Overview of Popular Benchmark Sets

IEEE Design & Test

Hierarchical ATPG for Analog Circuits and Systems

IEEE Design & Test

DfT and on-line test of high-performance data converters: a practical case

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Fast Fault Simulation for Nonlinear Analog Circuits

IEEE Design & Test

Thermal Testing of Analogue Integrated Circuits: A Case Study

Journal of Electronic Testing: Theory and Applications

Ultimate low cost analog BIST

Proceedings of the 40th annual Design Automation Conference

Digital Signature Proposal for Mixed-Signal Circuits

ITC '00 Proceedings of the 2000 IEEE International Test Conference

A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality

ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design

A Statistical Sampler for a New On-Line Analog Test Method

Journal of Electronic Testing: Theory and Applications

Subband Filtering Scheme for Analog and Mixed-Signal Circuit Testing

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Fast, Layout-Inclusive Analog Circuit Synthesis using Pre-Compiled Parasitic-Aware Symbolic Performance Models

Proceedings of the conference on Design, automation and test in Europe - Volume 1

LFSR-based BIST for analog circuits using slope detection

Proceedings of the 14th ACM Great Lakes symposium on VLSI

Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current

Journal of Electronic Testing: Theory and Applications

Generating decision regions in analog measurement spaces

GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI

Frequency Specification Testing of Analog Filters Using Wavelet Transform of Dynamic Supply Current

Journal of Electronic Testing: Theory and Applications

Testing Biquad Filters under Parametric Shifts Using X-Y Zoning

Journal of Electronic Testing: Theory and Applications

TBSA: Threshold-Based Simulation Accuracy Method for Fast Analog DC Fault Simulation

Journal of Electronic Testing: Theory and Applications

Proposal of Fault Diagnosis of Analog Circuits by Combining Operation-Region Model and X-Y Zoning Method: Case Study

Journal of Electronic Testing: Theory and Applications

Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model and X---Y Zoning Method

Journal of Electronic Testing: Theory and Applications

Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits

IEICE - Transactions on Information and Systems

System-on-Chip Test Architectures: Nanometer Design for Testability

System-on-Chip Test Architectures: Nanometer Design for Testability

Real-valued negative selection algorithm with a Quasi-Monte Carlo genetic detector generation

ICARIS'07 Proceedings of the 6th international conference on Artificial immune systems

A fuzzy classification approach for analog fault diagnosis applying immune algorithm

FSKD'09 Proceedings of the 6th international conference on Fuzzy systems and knowledge discovery - Volume 3

Test Generation Algorithm for Linear Systems Based on Genetic Algorithm

Journal of Electronic Testing: Theory and Applications

Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor

Journal of Electronic Testing: Theory and Applications

Multiple Soft Fault Diagnosis of Nonlinear Circuits Using the Continuation Method

Journal of Electronic Testing: Theory and Applications

A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection

Journal of Electronic Testing: Theory and Applications

Multiple catastrophic fault diagnosis of analog circuits considering the component tolerances

International Journal of Circuit Theory and Applications

Analog Circuits Fault Detection Using Cross-Entropy Approach

Journal of Electronic Testing: Theory and Applications

An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis

Journal of Electronic Testing: Theory and Applications