Testing Biquad Filters under Parametric Shifts Using X-Y Zoning

  • Authors:
  • R. Sanahuja;V. Barcons;L. Balado;J. Figueras

  • Affiliations:
  • Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya, Barcelona, Spain 08028;Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya, Barcelona, Spain 08028;Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya, Barcelona, Spain 08028;Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya, Barcelona, Spain 08028

  • Venue:
  • Journal of Electronic Testing: Theory and Applications
  • Year:
  • 2005

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Abstract

Testing mixed-signal circuits is a difficult task due to defect modeling challenges, observability and controllability restrictions and ATE bandwidth limitations. In this paper, the X-Y Zoning test of a Biquad filter is addressed to select the optimal excitation frequency and the best partition of the X-Y plane. Thus we obtain the best sensitivity of the BIST scheme to parametric shifts of the parameters defining the filter. The study has been particularized to shifts in the natural frequency f0 of the Biquad filter. Analytical results on the best input as well as the best partition of the observed X-Y Lissajous plots are obtained. Extensive MATLAB simulations validate the proposal, which has also been validated experimentally. For these experiments, multiple implementations of the Biquad with nominal and shifted parameters have been performed using a commercial Field Programmable Analog Array (FPAA). The experimental measures show good correlation with the analytical expressions and the simulations performed, and validate the proposed testing methodology.