Analog circuit test based on a digital signature

  • Authors:
  • A. Gómez;R. Sanahuja;L. Balado;J. Figueras

  • Affiliations:
  • Universitat Politècnica de Catalunya, Barcelona, Spain;Universitat Politècnica de Catalunya, Barcelona, Spain;Universitat Politècnica de Catalunya, Barcelona, Spain;Universitat Politècnica de Catalunya, Barcelona, Spain

  • Venue:
  • Proceedings of the Conference on Design, Automation and Test in Europe
  • Year:
  • 2010

Quantified Score

Hi-index 0.00

Visualization

Abstract

Production verification of analog circuit specifications is a challenging task requiring expensive test equipment and time consuming procedures. This paper presents a method for low cost on-chip parameter verification based on the analysis of a digital signature. A 65 nm CMOS on-chip monitor is proposed and validated in practice. The monitor composes two signals (x(t), y(t)) and divides the X-Y plane with nonlinear boundaries in order to generate a digital code for every analog (x, y) location. A digital signature is obtained using the digital code and its time duration. A metric defining a discrepancy factor is used to verify circuit parameters. The method is applied to detect possible deviations in the natural frequency of a Biquad filter. Simulated and experimental results show the possibilities of the proposal.