Oscillation-Test Technique for CMOS Operational Amplifiers by Monitoring Supply Current

Authors:
J. Font;J. Ginard;E. Isern;M. Roca;J. Segura;E. García
Affiliations:
Departament de Física, Universitat Illes Balears, Ctra. Valldemossa, km 7.5-07071 Palma de Mallorca;Departament de Física, Universitat Illes Balears, Ctra. Valldemossa, km 7.5-07071 Palma de Mallorca;Departament de Física, Universitat Illes Balears, Ctra. Valldemossa, km 7.5-07071 Palma de Mallorca;Departament de Física, Universitat Illes Balears, Ctra. Valldemossa, km 7.5-07071 Palma de Mallorca;Departament de Física, Universitat Illes Balears, Ctra. Valldemossa, km 7.5-07071 Palma de Mallorca;Departament de Física, Universitat Illes Balears, Ctra. Valldemossa, km 7.5-07071 Palma de Mallorca
Venue:
Analog Integrated Circuits and Signal Processing
Year:
2002

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Abstract

A comparison of the merits and possibilities of considering theoutput voltage and the negative supply current as test observableswhen using the Oscillation-test technique is carried out. Themethod is applied to CMOS opamps considering an exhaustive analysisof catastrophic defects (opens, shorts), GOS and floating gatesusing HSPICE. We analyze deviations in both frequency and signalamplitude of each observable comparing their sensitivity todefects. Results show that the supply current peak value providesthe highest defect coverage for a single opamp oscillator, whilethe oscillating frequency provides the highest fault coverage for adouble opamp oscillator.