Operation and modeling of the MOS transistor
Operation and modeling of the MOS transistor
Automatic control systems (7th ed.)
Automatic control systems (7th ed.)
Current vs. Logic Testing of Gate Oxide Short, Floating Gate and Bridging Failures in CMOS
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
A design-for-test technique for multistage analog circuits
ATS '95 Proceedings of the 4th Asian Test Symposium
A new quality estimation methodology for mixed-signal and analogue ICs
EDTC '97 Proceedings of the 1997 European conference on Design and Test
On-chip analog output response compaction
EDTC '97 Proceedings of the 1997 European conference on Design and Test
A Unified Approach for a Time-Domain Built-In Self-Test Technique and Fault Detection
GLS '98 Proceedings of the Great Lakes Symposium on VLSI '98
VLSID '95 Proceedings of the 8th International Conference on VLSI Design
Oscillation-test strategy for analog and mixed-signal integrated circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Oscillation-Test Technique for CMOS Operational Amplifiers by Monitoring Supply Current
Analog Integrated Circuits and Signal Processing
Digital Signature Proposal for Mixed-Signal Circuits
Journal of Electronic Testing: Theory and Applications
Digital Signature Proposal for Mixed-Signal Circuits
ITC '00 Proceedings of the 2000 IEEE International Test Conference
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This paper describes a test method for analogue (partsof) ICs that determines whether an IC is good or not bymeasuring the currents flowing through its constituent circuits.The ICCQ test method is not a full functional test. Itis aimed primarily ...