Analog methods for computer-aided circuit analysis & diagnosis
Analog methods for computer-aided circuit analysis & diagnosis
A decomposition approach for testing large analog networks
Journal of Electronic Testing: Theory and Applications
A Survey of Test Techniques for MCM Substrates
Journal of Electronic Testing: Theory and Applications - Special issue on multi-chip testing and design for testability
Parametric fault diagnosis for analog systems using functional mapping
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Analog and Mixed-Signal Benchmark Circuits-First Release
Proceedings of the IEEE International Test Conference
All-Pass SC Biquad Reconfiguration Scheme for Oscillation Based Analog BIST
ETS '04 Proceedings of the European Test Symposium, Ninth IEEE
Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current
Journal of Electronic Testing: Theory and Applications
An algorithm for multiple fault diagnosis in analogue circuits: Research Articles
International Journal of Circuit Theory and Applications
Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing)
Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing)
Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model and X---Y Zoning Method
Journal of Electronic Testing: Theory and Applications
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This paper offers a method for multiple soft fault diagnosis of nonlinear static circuits. The method enables us to locate the faulty elements and evaluate their parameters. It exploits a set of n nonlinear algebraic type diagnostic equations in n unknown variables and is oriented on finding multiple solutions of these equations. As a result, the method is capable of finding, in systematic manner, different sets of the parameters which satisfy the diagnostic test, rather than one specific set. For this purpose the continuation (homotopy) approach is applied and an efficient procedure for tracing a homotopy path is developed. The proposed method is especially useful at the pre-production stage, where corrections of the technological process are possible and the diagnostic time is not crucial. To illustrate the proposed approach two numerical examples are given.