Methods of Testing Discrete Semiconductors in the 1149.4 Environment
Journal of Electronic Testing: Theory and Applications
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
CδIDDQ: improving current-based testing and diagnosis through modified test pattern generation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Pruning-based trace signal selection algorithm
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Multiple Soft Fault Diagnosis of Nonlinear Circuits Using the Continuation Method
Journal of Electronic Testing: Theory and Applications
Roberts: reconfigurable platform for benchmarking real-time systems
ACM SIGARCH Computer Architecture News - ACM SIGARCH Computer Architecture News/HEART '12
On the optimality of K longest path generation algorithm under memory constraints
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
A scan pattern debugger for partial scan industrial designs
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
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