Proceedings of the 39th annual Design Automation Conference
On Selecting Testable Paths in Scan Designs
Journal of Electronic Testing: Theory and Applications
Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing)
Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing)
Fear, uncertainty and statistics
Proceedings of the 2007 international symposium on Physical design
Silicon speedpath measurement and feedback into EDA flows
Proceedings of the 44th annual Design Automation Conference
Invited paper: Variability in nanometer CMOS: Impact, analysis, and minimization
Integration, the VLSI Journal
A Simulator of Small-Delay Faults Caused by Resistive-Open Defects
ETS '08 Proceedings of the 2008 13th European Test Symposium
Process variation-aware test for resistive bridges
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
On the detection of delay faults
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
An Efficient Algorithm for Finding a Universal Set of Testable Long Paths
ATS '10 Proceedings of the 2010 19th IEEE Asian Test Symposium
Variation-Aware Fault Modeling
ATS '10 Proceedings of the 2010 19th IEEE Asian Test Symposium
Testability driven statistical path selection
Proceedings of the 48th Design Automation Conference
Efficient SAT-Based Search for Longest Sensitisable Paths
ATS '11 Proceedings of the 2011 Asian Test Symposium
Modeling, testing, and analysis for delay defects and noise effects in deep submicron devices
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Adequate coverage of small-delay defects in circuits affected by statistical process variations requires identification and sensitization of multiple paths through potential defect sites. Existing K longest path generation (KLPG) algorithms use a data structure called path store to prune the search space by restricting the number of sub-paths considered at the same time. While this restriction speeds up the KLPG process, the algorithms lose their optimality and do not guarantee that the K longest sensitizable paths are indeed found. We investigate, for the first time, the effects of missing some of the longest paths on the defect coverage. We systematically quantify how setting different limits on the path-store size affects the numbers and relative lengths of identified paths, as well as the run-times of the algorithm. We also introduce a new optimal KLPG algorithm that works iteratively and pinpointedly addresses defect locations for which the path-store size limit has been exceeded in previous iterations. We compare this algorithm with a naïve KLPG approach that achieves optimality by setting the path-store size limit to a very large value. Extensive experiments are reported for 45nm-technology data.