Pruning-based trace signal selection algorithm

Authors:
Kang Zhao;Jinian Bian
Affiliations:
Tsinghua University, China;Tsinghua University, China
Venue:
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Year:
2011

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Abstract

To improve the observability in the post-silicon validation, how to select the limited trace signals effectively for the data acquisition is the focus. This paper proposes an automated trace signal selection algorithm, which uses the pruning-based strategy to reduce the exploration space. The experiments indicate that the proposed algorithm can bring higher restoration ratios, and it is more effective compared to existing methods.