A method to diagnose faults in linear analog circuits using an adaptive tester
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Parametric fault diagnosis for analog systems using functional mapping
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Analog and Mixed-Signal Benchmark Circuits-First Release
Proceedings of the IEEE International Test Conference
Digital Signature Proposal for Mixed-Signal Circuits
ITC '00 Proceedings of the 2000 IEEE International Test Conference
DFT '03 Proceedings of the 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Fault Diagnosis of Analog Circuits by Operation-Region Model and X-Y Zoning Method
DFT '04 Proceedings of the Defect and Fault Tolerance in VLSI Systems, 19th IEEE International Symposium
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Characteristics of Fault Diagnosis for Analog Circuits Based on Preset Test
DFT '05 Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Multiple Soft Fault Diagnosis of Nonlinear Circuits Using the Continuation Method
Journal of Electronic Testing: Theory and Applications
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We have proposed a method for diagnosing analog circuits that is realized by combining the operation-region model and the X---Y zoning method. In the method, we could implement a diagnosis procedure based on a diagnostic method for digital circuits because we developed a data processing method to handle data discretely. In this paper, we improve the method by using an adaptive test to obtain a shorter diagnostic sequence length and show its characteristics. Moreover, we propose a new data processing method that utilizes the output response of a circuit to obtain better diagnostic performance. We demonstrate the effectiveness of the proposed methods by applying them to ITC'97 benchmark circuits with hard faults and soft faults. These improved methods can reduce the diagnostic sequence length without degrading the performance of diagnostic resolution and CPU time.