Cutting the high cost of testing
IEEE Spectrum
Optimal ordering of analog integrated circuit tests to minimize test time
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
Hierarchical statistical characterization of mixed-signal circuits using behavioral modeling
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Tolerance Analysis of Electron Circuits Using MathCAD
Tolerance Analysis of Electron Circuits Using MathCAD
Multifrequency Analysis of Faults in Analog Circuits
IEEE Design & Test
Industrial Relevance of Analog IFA: A Fact or a Fiction
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Fault Modeling for the Testing of Mixed Integrated Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Analog and Mixed-Signal Benchmark Circuits-First Release
Proceedings of the IEEE International Test Conference
Exploit Analog IFA to Improve Specification Based Tests
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Test Metrics for Analog Parametric Faults
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Test Generation for Accurate Prediction of Analog Specifications
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Yield simulation for integrated circuits (fault analysis, redundancy analysis, fabrication defects)
Yield simulation for integrated circuits (fault analysis, redundancy analysis, fabrication defects)
Pseudorandom testing for mixed-signal circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Analog testing by characteristic observation inference
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Digital-Compatible Testing Scheme for Operational Amplifier
Journal of Electronic Testing: Theory and Applications
Fault analysis and simulation of large scale industrial mixed-signal circuits
Proceedings of the Conference on Design, Automation and Test in Europe
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Anti-random testing has proved useful in a series of empirical evaluations. The basic premise of anti-random testing is to chose new test vectors that are as far away from existing test inputs as possible. The distance measure is either Hamming distance ...