Design based analog testing by Characteristic Observation Inference
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Fault simulation for mixed-signal systems
Journal of Electronic Testing: Theory and Applications
LIMSoft: Automated Tool for Design and Test Integration of Analog Circuits
Proceedings of the IEEE International Test Conference on Test and Design Validity
Realistic-Faults Mapping Scheme for the Fault Simulation of Integrated Analogue CMOS Circuits
Proceedings of the IEEE International Test Conference on Test and Design Validity
Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis
Proceedings of the IEEE International Test Conference
Oscillation-test strategy for analog and mixed-signal integrated circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Defect Level as a Function of Fault Coverage
IEEE Transactions on Computers
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Defect level evaluation in an IC design environment
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
On Maximizing the Coverage of Catastrophic and Parametric Faults
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
A parametric test method for analog components in integrated mixed-signal circuits
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Structural Fault Based Specification Reduction for Testing Analog Circuits
Journal of Electronic Testing: Theory and Applications
Proceedings of the 42nd annual Design Automation Conference
Pseudorandom functional BIST for linear and nonlinear MEMS
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Test Development Through Defect and Test Escape Level Estimation for Data Converters
Journal of Electronic Testing: Theory and Applications
Proceedings of the conference on Design, automation and test in Europe
Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing
Journal of Electronic Testing: Theory and Applications
A general method to evaluate RF BIST techniques based on non-parametric density estimation
Proceedings of the conference on Design, automation and test in Europe
Adaptive test elimination for analog/RF circuits
Proceedings of the 46th Annual Design Automation Conference
Evaluation of analog/RF test measurements at the design stage
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Low-cost digital detection of parametric faults in cascaded ΣΔ modulators
IEEE Transactions on Circuits and Systems Part I: Regular Papers
Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation
Journal of Electronic Testing: Theory and Applications
Analog test metrics estimates with PPM accuracy
Proceedings of the International Conference on Computer-Aided Design
Multidimensional analog test metrics estimation using extreme value theory and statistical blockade
Proceedings of the 50th Annual Design Automation Conference
Scalable and efficient analog parametric fault identification
Proceedings of the International Conference on Computer-Aided Design
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This paper summarizes the complete range of analog defects and resultant faults. A complete set of metrics is then derived for measuring the quality of analog tests. The probability-based equations for fault coverage, defect level, yield coverage, and yield loss are self-consistent, and consistent with existing equations for digital test metrics. We introduce the concept of partial coverage, show that it is inherent to analog testing, and show that coverage cannot be calculated without knowing the performance specifications for a circuit, as well as the process parameter distributions. Practical methods for calculating probabilities are discussed, and simple, illustrative examples given.