ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Testability analysis and multi-frequency ATPG for analog circuits and systems
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Parametric fault diagnosis for analog systems using functional mapping
DATE '99 Proceedings of the conference on Design, automation and test in Europe
A fault simulation methodology for MEMS
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Partial simulation-driven ATPG for detection and diagnosis of faults in analog circuits
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Hierarchical ATPG for Analog Circuits and Systems
IEEE Design & Test
ARVLSI '99 Proceedings of the 20th Anniversary Conference on Advanced Research in VLSI
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Test Metrics for Analog Parametric Faults
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
An Analog Circuit Fault Characterization Methodology
Journal of Electronic Testing: Theory and Applications
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Journal of Electronic Testing: Theory and Applications
Case base management for analog circuits diagnosis improvement
ICCBR'03 Proceedings of the 5th international conference on Case-based reasoning: Research and Development
Block-level Bayesian diagnosis of analogue electronic circuits
Proceedings of the Conference on Design, Automation and Test in Europe
Fault analysis and simulation of large scale industrial mixed-signal circuits
Proceedings of the Conference on Design, Automation and Test in Europe
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