Block-level Bayesian diagnosis of analogue electronic circuits

Authors:
Shaji Krishnan;Klaas D. Doornbos;Rudi Brand;Hans G. Kerkhoff
Affiliations:
TNO, Zeist, The Netherlands;Business unit CAR, NXP Semiconductors, Nijmegen, The Netherlands;Business unit CAR, NXP Semiconductors, Nijmegen, The Netherlands;University of Twente, Enschede, The Netherlands
Venue:
Proceedings of the Conference on Design, Automation and Test in Europe
Year:
2010

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Abstract

Daily experience with product designers, test and diagnosis engineers it is realized that the depth of interaction among them, ought be high for sucessfull diagnosis of analogue circuits. With this knowledge in mind, a responsibility was undertaken to choose a popular diagnostic method and define a systematic procedure that binds together the knowledge of a product from a design, test and diagnostic engineer. A set of software utilities was developed that assists in automating these procedures and in collecting appropriate data for effective diagnosis of analogue circuits. This paper will discuss the chosen methodology for diagnosis and the associated procedures for block-level diagnosis of analogue electronic circuits in detail. The paper is concluded with an illustration of the methodology and the related procedures of an industrial automotive voltage regulator circuit as a representative example.