iDD Pulse Response Testing of Analog and Digital CMOS Circuits

Improving bus test via IDDT and boundary scan

Proceedings of the 38th annual Design Automation Conference

A novel wavelet transform based transient current analysis for fault detection and localization

Proceedings of the 39th annual Design Automation Conference

Real-Time Current Testing for A/D Converters

IEEE Design & Test

Test Method Evaluation Experiments & Data

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Power Supply Transient Signal Integration Circuit

ITC '01 Proceedings of the 2001 IEEE International Test Conference

Detecting Delay Faults using Power Supply Transient Signal Analysis

ITC '01 Proceedings of the 2001 IEEE International Test Conference

Transient Power Supply Voltage (V DDT ) Analysis for Detecting IC Defects

ITC '97 Proceedings of the 1997 IEEE International Test Conference

IDD Pulse Response Testing Applied to Complex CMOS ICs

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Defect Detection using Power Supply Transient Signal Analysis

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Fault Simulation Model for i{DDT} Testing: An Investigation

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium

IDDX-based test methods: A survey

ACM Transactions on Design Automation of Electronic Systems (TODAES)

Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current

Journal of Electronic Testing: Theory and Applications

A novel wavelet transform-based transient current analysis for fault detection and localization

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Defect Simulation Methodology for iDDT Testing

Journal of Electronic Testing: Theory and Applications

Re-configuration of sub-blocks for effective application of time domain tests

Proceedings of the conference on Design, automation and test in Europe

Block-level Bayesian diagnosis of analogue electronic circuits

Proceedings of the Conference on Design, Automation and Test in Europe

Defect classes - an overdue paradigm for CMOS IC testing

ITC'94 Proceedings of the 1994 international conference on Test

Analogue fault simulation based on layout dependent fault models

ITC'94 Proceedings of the 1994 international conference on Test