Ten lectures on wavelets
Testing of static random access memories by monitoring dynamic power supply current
Journal of Electronic Testing: Theory and Applications
Monitoring Power Dissipation for Fault Detection
Journal of Electronic Testing: Theory and Applications
Fault Detection and Location Using IDD Waveform Analysis
IEEE Design & Test
Digital Integrated Circuit Testing using Transient Signal Analysis
Proceedings of the IEEE International Test Conference on Test and Design Validity
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
ITC '98 Proceedings of the 1998 IEEE International Test Conference
iDD Pulse Response Testing of Analog and Digital CMOS Circuits
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
IDD Waveforms Analysis for Testing of Domino and Low Voltage Static CMOS Circuits
GLS '98 Proceedings of the Great Lakes Symposium on VLSI '98
Transient Current Testing Based on Current (Charge) Integration
IDDQ '98 Proceedings of the IEEE International Workshop on IDDQ Testing
Transient Current Testing of 0.25 µm CMOS Devices
ITC '99 Proceedings of the 1999 IEEE International Test Conference
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current
Journal of Electronic Testing: Theory and Applications
Test Consideration for Nanometer-Scale CMOS Circuits
IEEE Design & Test
Defect Simulation Methodology for iDDT Testing
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
Hi-index | 0.00 |
Transient current (IDD) based testing has been often cited and investigated as an alternative and/or supplement to quiescent current (IDDQ) testing. While the potential of IDD testing for fault detection has been established, there is no known efficient method for fault diagnosis using IDD analysis. In this paper, we present a novel integrated method for fault detection and localization using wavelet transform based IDD waveform analysis. The time-frequency resolution property of wavelet transform helps us detect as well as localize faults in digital CMOS circuits. Experiments performed on measured data from a fabricated 8-bit shift register and simulation data from more complex circuits show promising results for both detection and localization. Wavelet based detection method shows superior sensitivity than spectral and time domain methods. The effectiveness of the localization method in presence of process variation, measurement noise and complex power supply network is addressed.