Principles of CMOS VLSI design: a systems perspective
Principles of CMOS VLSI design: a systems perspective
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Transient power supply current monitoring—a new test method for CMOS VLSI circuits
Journal of Electronic Testing: Theory and Applications
An approach to dynamic power consumption current testing of CMOS ICs
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Detection and location of faults and defects using digital signal processing
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Experimental Results on BIC Sensors for Transient Current Testing
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
A novel wavelet transform based transient current analysis for fault detection and localization
Proceedings of the 39th annual Design Automation Conference
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In this paper, we suggest that the dynamic power dissipation of acircuit can be used for fault detection. Even those faults which do notaffect static power dissipation can be detected by monitoring dynamic powerdissipation. We discuss how stuck-at, stuck-open, and redundant faults maybe detected by monitoring dynamic power dissipation. In many cases, theFourier spectra of the supply currents in the good and faulty circuits willalso be very different. Further, specific tests can be applied so as toimprove fault coverage. Power monitoring is verified using simulation, andalso experimentally, for example circuits.