Experimental Results on BIC Sensors for Transient Current Testing

Authors:
R. Picos;M. Roca;E. Isern;J. Segura;E. García-Moreno
Affiliations:
Physics Department, University of the Balearic Islands, Cra Valldemossa km 7.5, Palma de Mallorca, 07071 Spain. dfseir4@ps.uib.es;Physics Department, University of the Balearic Islands, Cra Valldemossa km 7.5, Palma de Mallorca, 07071 Spain. dfseir4@ps.uib.es;Physics Department, University of the Balearic Islands, Cra Valldemossa km 7.5, Palma de Mallorca, 07071 Spain. dfseir4@ps.uib.es;Physics Department, University of the Balearic Islands, Cra Valldemossa km 7.5, Palma de Mallorca, 07071 Spain. dfseir4@ps.uib.es;Physics Department, University of the Balearic Islands, Cra Valldemossa km 7.5, Palma de Mallorca, 07071 Spain. dfseir4@ps.uib.es
Venue:
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
Year:
2000

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Abstract

In this work experimental results on a built-in currentsensor for dynamic current testing, i(t), based onintegration concepts are presented. The experimental validationproposed in this work is done through a VLSI CMOS circuitimplemented in a 0.7 μm technology. Different experiences havebeen developed analyzing the detectability of several kind of defectsthrough this technique. The encouraging results obtained presentthis technique as an attractive complement to boolean and I testing.