Analog Integrated Circuits and Signal Processing
Experimental Results on BIC Sensors for Transient Current Testing
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
IDDQ Testing: Issues Present and Future
IEEE Design & Test
CMOS IC reliability indicators and burn-in economics
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Test Method Evaluation Experiments & Data
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Improved Wafer-level Spatial Analysis for IDDQ Limit Setting
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A Practical Built-In Current Sensor for IDDQ Testing
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Transient Power Supply Voltage (V DDT ) Analysis for Detecting IC Defects
ITC '97 Proceedings of the 1997 IEEE International Test Conference
ITC '97 Proceedings of the 1997 IEEE International Test Conference
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Transactions on high-performance embedded architectures and compilers III
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