On the Effect of ISSQ Testing in Reducing Early Failure Rate
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Digital Integrated Circuit Testing using Transient Signal Analysis
Proceedings of the IEEE International Test Conference on Test and Design Validity
IDDQ Test: Sensitivity Analysis of Scaling
Proceedings of the IEEE International Test Conference on Test and Design Validity
High Resolution IDDQ Characterization and Testing - Practical Issues
Proceedings of the IEEE International Test Conference on Test and Design Validity
High-Speed IDDQ Measurement Circuit
Proceedings of the IEEE International Test Conference on Test and Design Validity
iDD Pulse Response Testing of Analog and Digital CMOS Circuits
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
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Transient power supply voltage (vDDT)analysis is a new testing technique demonstrated as apowerful alternative and complement to IDDQ testing.vDDT analysis takes advantage of the limited responsetime of a voltage supply to the changing powerdemand of an IC during operation. Changes in theVDD response time can be used to detect increases inthe power demand of a microcontroller withresolutions of 20 nA at 100 kHz, 1 µA at 1 MHz, and2.5 µA at 1.5 MHz. These current sensitivities havebeen shown for ICs with very low IDDQ (