A Low-Loss Built-In Current Sensor
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Influence of manufacturing variations in IDDQ measurements: a new test criterion
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Proceedings of the 38th annual Design Automation Conference
IDDQ Testing: Issues Present and Future
IEEE Design & Test
On-Chip IDDQ Testing in the AE11 Fail-Stop Controller
IEEE Design & Test
CMOS IC reliability indicators and burn-in economics
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Improving Delta-IDDQ-based test methods
ITC '00 Proceedings of the 2000 IEEE International Test Conference
DECOUPLE: DEFECT CURRENT DETECTION IN DEEP SUBMICRON IDDQ
ITC '00 Proceedings of the 2000 IEEE International Test Conference
The Future of Delta IDDQ Testing
ITC '01 Proceedings of the 2001 IEEE International Test Conference
AN IDDQ SENSOR CIRCUIT FOR LOW-VOLTAGE ICS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Transient Power Supply Voltage (V DDT ) Analysis for Detecting IC Defects
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Intrinsic Leakage in Low Power Deep Submicron CMOS ICs
ITC '97 Proceedings of the 1997 IEEE International Test Conference
IDDQ Characterization in Submicron CMOS
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Statistical Threshold Formulation For Dynamic Idd Test
ITC '99 Proceedings of the 1999 IEEE International Test Conference
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