Principles of CMOS VLSI design: a systems perspective
Principles of CMOS VLSI design: a systems perspective
A practical current sensing technique for IDDQ testing
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Digital integrated circuits: a design perspective
Digital integrated circuits: a design perspective
Defect Classes - An Overdue Paradigm for CMOS IC
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
IDDQ Testing of CMOS Opens: An Experimental Study
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Intel 386TM EX Embedded Processor IDDQ Testing
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Towards an Effective IDDQ Test Vector Selection and Application Methodology
Proceedings of the IEEE International Test Conference on Test and Design Validity
High Resolution IDDQ Characterization and Testing - Practical Issues
Proceedings of the IEEE International Test Conference on Test and Design Validity
Correlating Defects to Functional and IDDQ Tests
Proceedings of the IEEE International Test Conference on Test and Design Validity
IDDQ and AC Scan: The War Against Unmodelled Defects
Proceedings of the IEEE International Test Conference on Test and Design Validity
Circuit Design for Built-in Current Testing
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
A novel built-in current sensor for I/sub DDQ/ testing of deep submicron CMOS ICs
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Realistic Coverages of Voltage and Current Tests
IDDQ '96 Proceedings of the 1996 IEEE International Workshop on IDDQ Testing (IDDQ '96)
A Fast and Sensitive Built-in Current Sensor for IDDQ Testing
IDDQ '96 Proceedings of the 1996 IEEE International Workshop on IDDQ Testing (IDDQ '96)
An Efficient IDDQ Test Generation Scheme for Bridging Faults in CMOS Digital Circuits
IDDQ '96 Proceedings of the 1996 IEEE International Workshop on IDDQ Testing (IDDQ '96)
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A novel IDDQ sensor circuit with high sensitivity thatoperates at a low supply voltage is proposed. The circuitdoes not need an I-V translator but is directly driven by anabnormal IDDQ. The circuit can operate at either 5-V VDDor 3.3-V VDD with the same design. Simulation results showthat it can detect a 16- mA abnormal IDDQ at 3.3-V VDDand can reduce the voltage drop and performance penalty ofthe circuit under test.